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An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production waters. Reticles are built upon blanks: substrates of quartz deposited with absorber films. Íæż½ã½ã's portfolio of reticle inspection, metrology and data analytics systems leverage leading-edge optical and sensor technologies and Al-driven algorithms to help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.<\/p>","link":"https:\/\/www.kla.com\/products\/reticle-manufacturing","name":"Reticle Manufacturing","slug":"reticle-manufacturing","taxonomy":"product_cat","parent":0,"meta":[],"acf":[],"yoast_head":"\nReticle Manufacturing | Íæż½ã½ã<\/title>\n<meta name=\"description\" content=\"Íæż½ã½ã's inspection & metrology systems for reticle manufacturing & quality control help reduce yield risk by identifying defects & pattern placement errors.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.kla.com\/zh-hans\/products\/reticle-manufacturing\" \/>\n<meta property=\"og:locale\" content=\"zh_CN\" 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