{"id":213,"count":15,"description":"Íæż½ã½ã\u2019s wafer manufacturing portfolio includes defect inspection and review, metrology and data management systems that help manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools leverage innovative optics technologies and Al algorithms to assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography.\r\nData analysis and management systems proactively identify wafer\/substrate fabrication process excursions that can lead to yield loss. In situ process monitoring solutions help engineers visualize, diagnose and control process and water handling conditions. Íæż½ã½ã's wafer manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOl, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO<sub>3<\/sub>, LiNBO<sub>3<\/sub>, and epitaxial waters.","link":"https:\/\/www.kla.com\/products\/wafer-manufacturing","name":"Wafer Manufacturing","slug":"wafer-manufacturing","taxonomy":"product_cat","parent":0,"meta":[],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v24.7 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>Wafer Manufacturing | Íæż½ã½ã<\/title>\n<meta name=\"description\" content=\"Íæż½ã½ã\u2019s portfolio of defect inspection and review, metrology and data management systems helps substrate manufacturers manage quality throughout the wafer fabrication process.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" 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