Upcoming Event
View AllJohns Hopkins Mach Conference
Íæż½ã½ã will be attending the Johns Hopkins Mach Conference. Please come see us to discuss the advantages of our nanoindentation and optical profiling systems.
| Event Date | April 9 - 11, 2025 |
| Location |
Technical Literature
Browse application notes and technical papers from Íæż½ã½ã Instruments Application Engineers and customers, covering a variety of use cases for Íæż½ã½ã Instruments defect inspection and metrology products.
Instruments Articles
Íæż½ã½ã Instruments? Biomedical Solutions Protect Patients, Increase Yield for Manufacturers
Apr 4, 2023
In the biomedical industry, many different types of devices such as sensors, monitors, prosthetics, drug delivery systems and implants are...
Compound Semiconductor Innovation Advances EVs and Other Green Technologies
Apr 27, 2022
As the world works to reduce greenhouse gas emissions, global adoption of electric vehicles (EVs) is driving an increased demand...
Rougher Surfaces, Steeper Slopes ¨C Navigating the High Performance Capability of the New Generation Filmetrics? Profilm3D?
Jan 25, 2022
The Íæż½ã½ã Instruments? portfolio of optical profiler tools are widely used in the industry due to their rapid measurement time...
Timeline of Innovation
Our history of innovation and deep expertise have built a broad portfolio of measurement and inspection solutions that address every requirement and environment. See how it all started from the inception of the Alpha-Step® product line in 1977 through our latest product innovations.
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